Defect Mechanism in Lead-Free Piezoelectric Thin Films Clarified: Oxygen-Vacancy Distribution and Migration Determine Electrical Degradation and Lifetime

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A research team led by Professor Takeshi Yoshimura of the Department of Electrical and Electronic Information Engineering, in collaboration with Osaka Metropolitan University and The Pennsylvania State University, clarified how the distribution and migration of oxygen vacancies govern charge transport, electrical degradation, and long-term reliability in Mn-doped BiFeO₃ lead-free piezoelectric thin films.

The findings provide materials and device design guidelines for highly reliable, environmentally friendly lead-free piezoelectric devices.